This new paper reviews the core concepts surrounding the optical interfaces that are available for ICP-OES spectrometers today and discusses the relative strengths and weaknesses of each approach.
The paper explains how each technique works and why understanding the plasma-viewing interface should be a major factor in the selection of the best technology and instrument for your laboratory or specific area of research.
The paper also introduces a unique new plasma observation approach called MultiView. MultiView technology was recently introduced by SPECTRO Analytical Instruments in its new SPECTRO ARCOS ICP-OES and offers users full axial sensitivity and full radial precision with out any dual-view compromises.